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A compilation of patentes to mechanical metrology standards and high-precision measurement of mechanical quantities


Rodrigo Junqueira Leo; Luis Felipe Cassales; Yuri Basile Tukoff-Guimares; Manuel Antnio Pires Castanho


Referência:

LEÃO, Rodrigo Junqueira; CASSALES, Luis Felipe; TUKOFF-GUIMARÃES, Yuri Basile; CASTANHO, Manuel Antônio Pires. A compilation of patentes to mechanical metrology standards and high-precision measurement of mechanical quantities. Measurement, v.94, p.523-530, Dec., 2016. 


Acesso ao artigo no site do ScienceDirect: